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Imaging silicon by atomic force microscopy with crystallographically oriented tips

URN to cite this document:
urn:nbn:de:bvb:355-epub-253346
Giessibl, Franz J. ; Hembacher, Stefan ; Bielefeldt, Hartmut ; Mannhart, Jochen
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Date of publication of this fulltext: 10 Jul 2012 14:33


Abstract

The images obtained by atomic force microscopy (AFM) originate from a convolution of atomic tip and sample states. Since the vertical resolution of AFM is approaching the picometer level, the atomic and subatomic structure of the tip is becoming increasingly important. Here, we demonstrate the preparation of crystallographically oriented AFM tips by breaking a silicon wafer along its preferential ...

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