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Imaging silicon by atomic force microscopy with crystallographically oriented tips

Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut and Mannhart, Jochen (2001) Imaging silicon by atomic force microscopy with crystallographically oriented tips. Applied Physics A: Materials Science & Processing 72 (Suppl1), pp. 15-17.

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Abstract

The images obtained by atomic force microscopy (AFM) originate from a convolution of atomic tip and sample states. Since the vertical resolution of AFM is approaching the picometer level, the atomic and subatomic structure of the tip is becoming increasingly important. Here, we demonstrate the preparation of crystallographically oriented AFM tips by breaking a silicon wafer along its preferential ...

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Item type:Article
Date:27 March 2001
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:BMBF 13N6918
Identification Number:
ValueType
10.1007/s003390100627DOI
Classification:
NotationType
07.79.LhPACS
34.20.CfPACS
68.37.EPACS
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Item ID:25334
Owner only: item control page

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