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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-253346
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.25334
Alternative Links zum Volltext:DOI
Zusammenfassung
The images obtained by atomic force microscopy (AFM) originate from a convolution of atomic tip and sample states. Since the vertical resolution of AFM is approaching the picometer level, the atomic and subatomic structure of the tip is becoming increasingly important. Here, we demonstrate the preparation of crystallographically oriented AFM tips by breaking a silicon wafer along its preferential ...
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