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Advances in Atomic Force Microscopy

URN to cite this document:
urn:nbn:de:bvb:355-epub-253366
Giessibl, Franz J.
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Date of publication of this fulltext: 13 Jul 2012 08:15


Abstract

This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation atomic force ...

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