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Atomic Force Microscopy on Its Way to Adolescence

Giessibl, Franz J.



Abstract

When the atomic force microscope (AFM) was introduced in 1986, its potential to resolve surfaces with true atomic resolution was already proposed. However, substantial problems had to be overcome before atomic resolution became possible by AFM. Today, true atomic resolution by AFM is standard practice. This article discusses the influence of the cantilever stiffness and — amplitude on noise and ...

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