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Atomic Force Microscopy on Its Way to Adolescence

Giessibl, Franz J. (2003) Atomic Force Microscopy on Its Way to Adolescence. AIP Conference Proceedings 696 (1), pp. 60-67.

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When the atomic force microscope (AFM) was introduced in 1986, its potential to resolve surfaces with true atomic resolution was already proposed. However, substantial problems had to be overcome before atomic resolution became possible by AFM. Today, true atomic resolution by AFM is standard practice. This article discusses the influence of the cantilever stiffness and — amplitude on noise and ...


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Item type:Article
Date:18 December 2003
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
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Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Item ID:25337
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