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Microscopic mapping of strain relaxation in uncoalesced pendeoepitaxial GaN on SiC

URN to cite this document:
urn:nbn:de:bvb:355-epub-26074
DOI to cite this document:
10.5283/epub.2607
Schwarz, Uli ; Schuck, P. ; Mason, M. ; Grober, R. ; Roskowsky, A. ; Einfeldt, S. ; Davis, R.
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Date of publication of this fulltext: 05 Aug 2009 13:40
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