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Atomic force microscopy in the picometer regime - resolving spins and non-trivial surface terminations

Pielmeier, Florian (2014) Atomic force microscopy in the picometer regime - resolving spins and non-trivial surface terminations. PhD, Universität Regensburg.

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Date of publication of this fulltext: 29 Sep 2014 15:47

Abstract (English)

Atomic Force MIcrosocpy (AFM) offers the unique possiblity to study conductive as well as insulating surfaces at the atomic scale. While achieving atomic or sub-molecular resolution with low temperature AFM is well established nowadays, the resolution of subatomic features and magnetic exchange interactions remains a challenge. The first part of this work deals with the characterization and ...


Translation of the abstract (German)

Die Rasterkraftmikroskopie (RKM) bietet die einzigartige Möglichkeit leitfähige wie auch isolierende Oberflächen auf atomarer Skala zu untersuchen. Das Erreichen von atomaren und submolekularer Auflösung mittels Tieftemperatur-RKM ist zwischenzeitlich kein Problem mehr, jedoch stellt die Auflösung subatomarer Strukturen und von magnetischen Austauschkräften nach wie vor eine Herausforderung dar. ...


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Item type:Thesis of the University of Regensburg (PhD)
Date:29 September 2014
Referee:Prof. Dr. Franz J. Gießibl
Date of exam:19 September 2014
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Keywords:atomic force microscopy, scanning tunneling microsocpy, scanning probe microsocpy, qPlus sensor, needle sensor, signal-to-noise ratio, subatomic resolution, spin resolution, exchange interaction, topological insulator
Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:30782
Owner only: item control page


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