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Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllers

Wutscher, Thorsten, Niebauer, Johannes and Giessibl, Franz J. (2013) Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllers. Review of Scientific Instruments 84, 073704-1.

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Date of publication of this fulltext: 27 May 2016 05:50

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Abstract

We present an electronic circuit that allows to calibrate and troubleshoot scanning probe microscopy (SPM) controllers with respect to their noise performance. The control signal in an SPM is typically highly nonlinear—the tunneling current in scanning tunneling microscopy (STM) varies exponentially with distance. The exponential current-versus-voltage characteristics of diodes allow to model the ...

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Item type:Article
Date:9 July 2013
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:SFB 689: Spinphänomene in reduzierten Dimensionen
Identification Number:
ValueType
10.1063/1.4812636DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:33804
Owner only: item control page

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