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Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllers

URN to cite this document:
urn:nbn:de:bvb:355-epub-338045
DOI to cite this document:
10.5283/epub.33804
Wutscher, Thorsten ; Niebauer, Johannes ; Giessibl, Franz J.
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Date of publication of this fulltext: 27 May 2016 05:50


Abstract

We present an electronic circuit that allows to calibrate and troubleshoot scanning probe microscopy (SPM) controllers with respect to their noise performance. The control signal in an SPM is typically highly nonlinear—the tunneling current in scanning tunneling microscopy (STM) varies exponentially with distance. The exponential current-versus-voltage characteristics of diodes allow to model the ...

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