Giessibl, Franz J. and Trafas, Brian M. (1994) Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum. Review of Scientific Instruments 65 (6), pp. 1923-1929.
| PDF Download (1MB) |
Abstract
Piezoresistive cantilevers have been utilized in a novel ultrahigh vacuum scanning probe microscope which allows in situscanning tunneling microscopy(STM), contact atomic force microscopy(AFM), and noncontact atomic force microscopy. The instrument uses interchangeable tungsten tips (for STM imaging) and piezoresistive cantilevers (for AFM or STM imaging) and is capable of atomic resolution in ...
Export bibliographical data
| Item type: | Article | ||||
|---|---|---|---|---|---|
| Date: | June 1994 | ||||
| Institutions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||
| Identification Number: |
| ||||
| Dewey Decimal Classification: | 500 Science > 530 Physics | ||||
| Status: | Published | ||||
| Refereed: | Yes, this version has been refereed | ||||
| Created at the University of Regensburg: | Unknown | ||||
| Item ID: | 33829 |
Owner only: item control page
Download Statistics