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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-338297
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.33829
Alternative Links zum Volltext:DOI
Zusammenfassung
Piezoresistive cantilevers have been utilized in a novel ultrahigh vacuum scanning probe microscope which allows in situscanning tunneling microscopy(STM), contact atomic force microscopy(AFM), and noncontact atomic force microscopy. The instrument uses interchangeable tungsten tips (for STM imaging) and piezoresistive cantilevers (for AFM or STM imaging) and is capable of atomic resolution in ...
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