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Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum

Giessibl, Franz J. and Trafas, Brian M. (1994) Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum. Review of Scientific Instruments 65 (6), pp. 1923-1929.

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Abstract

Piezoresistive cantilevers have been utilized in a novel ultrahigh vacuum scanning probe microscope which allows in situscanning tunneling microscopy(STM), contact atomic force microscopy(AFM), and noncontact atomic force microscopy. The instrument uses interchangeable tungsten tips (for STM imaging) and piezoresistive cantilevers (for AFM or STM imaging) and is capable of atomic resolution in ...

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Item type:Article
Date:June 1994
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1063/1.1145232DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Item ID:33829
Owner only: item control page

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