Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum

URN to cite this document:: urn:nbn:de:bvb:355-epub-338297
DOI to cite this document:: 10.5283/epub.33829

Giessibl, Franz J. ; Trafas, Brian M.

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Date of publication of this fulltext: 31 May 2016 08:15

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Abstract

Piezoresistive cantilevers have been utilized in a novel ultrahigh vacuum scanning probe microscope which allows in situscanning tunneling microscopy(STM), contact atomic force microscopy(AFM), and noncontact atomic force microscopy. The instrument uses interchangeable tungsten tips (for STM imaging) and piezoresistive cantilevers (for AFM or STM imaging) and is capable of atomic resolution in ...