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Atomic Force Microscopy in Ultrahigh Vacuum

Giessibl, Franz J. (1994) Atomic Force Microscopy in Ultrahigh Vacuum. Japanese Journal of Applied Physics (JJAP) 33, Part 1 (6B), pp. 3726-3734.

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Abstract

Since its invention in 1986, atomic force microscopy (AFM) has been used mainly in ambient conditions. Recent advances in instrumentation have fostered the application of AFM in ultrahigh vacuum (UHV). AFM experiments performed in UHV have led to a better understanding of the tip-sample interaction. This article reviews the theory related to achieving true atomic resolution of AFM in UHV in both ...

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Item type:Article
Date:June 1994
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1143/JJAP.33.3726DOI
Keywords:AFM, STM, UHV, Si (111)7×7, noncontact mode, attractive mode, contact mode, atomic resolution, tip-sample interaction, force measurement
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Item ID:33830
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