Atomic Force Microscopy in Ultrahigh Vacuum
Article
Giessibl, Franz J. (1994) Atomic Force Microscopy in Ultrahigh Vacuum. Japanese Journal of Applied Physics (JJAP) 33, Part 1 (6B), pp. 3726-3734.Alternative links to fulltext
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Details
| Item type | Article | ||||
| Journal or Publication Title | Japanese Journal of Applied Physics (JJAP) | ||||
| Publisher | Institute of Physics Publishing (IOP) ; Japan Society of Applied Physics (JSAP) | ||||
| Volume | 33, Part 1 | ||||
| Number of Issue or Book Chapter | 6B | ||||
| Page Range | pp. 3726-3734 | ||||
| Date | June 1994 | ||||
| Date of publication | 31 May 2016 08:04 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||
| Identification Number |
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| Keywords | AFM, STM, UHV, Si (111)7×7, noncontact mode, attractive mode, contact mode, atomic resolution, tip-sample interaction, force measurement | ||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Yes, this version has been refereed | ||||
| Created at the University of Regensburg | Unknown | ||||
| Item ID | 33830 |
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