Giessibl, Franz J. (1994) Atomic Force Microscopy in Ultrahigh Vacuum. Japanese Journal of Applied Physics (JJAP) 33, Part 1 (6B), pp. 3726-3734.
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Abstract
Since its invention in 1986, atomic force microscopy (AFM) has been used mainly in ambient conditions. Recent advances in instrumentation have fostered the application of AFM in ultrahigh vacuum (UHV). AFM experiments performed in UHV have led to a better understanding of the tip-sample interaction. This article reviews the theory related to achieving true atomic resolution of AFM in UHV in both ...
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| Item type: | Article | ||||
|---|---|---|---|---|---|
| Date: | June 1994 | ||||
| Institutions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||
| Identification Number: |
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| Keywords: | AFM, STM, UHV, Si (111)7×7, noncontact mode, attractive mode, contact mode, atomic resolution, tip-sample interaction, force measurement | ||||
| Dewey Decimal Classification: | 500 Science > 530 Physics | ||||
| Status: | Published | ||||
| Refereed: | Yes, this version has been refereed | ||||
| Created at the University of Regensburg: | Unknown | ||||
| Item ID: | 33830 |
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