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Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy

Giessibl, Franz J. and Binnig, Gerd (1992) Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy. Physical Review B (PRB) 45 (23), 13815(R).

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Abstract

An electrostatic imaging mechanism is presented which allows atomic resolution of the surface of ionic crystals by atomic force microscopy (AFM). In the x-y plane the electrostatic field due to the ion charges reflects the periodicity of the surface lattice. If the tip of the AFM stylus is polarizable, an attractive force between tip and sample will exist and allow imaging of the surface in a ...

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Item type:Article
Date:15 June 1992
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1103/PhysRevB.45.13815DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Item ID:33833
Owner only: item control page

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