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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-338331
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.33833
Alternative Links zum Volltext:DOI
Zusammenfassung
An electrostatic imaging mechanism is presented which allows atomic resolution of the surface of ionic crystals by atomic force microscopy (AFM). In the x-y plane the electrostatic field due to the ion charges reflects the periodicity of the surface lattice. If the tip of the AFM stylus is polarizable, an attractive force between tip and sample will exist and allow imaging of the surface in a ...
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