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Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy

URN to cite this document:
urn:nbn:de:bvb:355-epub-338331
DOI to cite this document:
10.5283/epub.33833
Giessibl, Franz J. ; Binnig, Gerd
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Date of publication of this fulltext: 31 May 2016 08:12


Abstract

An electrostatic imaging mechanism is presented which allows atomic resolution of the surface of ionic crystals by atomic force microscopy (AFM). In the x-y plane the electrostatic field due to the ion charges reflects the periodicity of the surface lattice. If the tip of the AFM stylus is polarizable, an attractive force between tip and sample will exist and allow imaging of the surface in a ...

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