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Gustafsson, Alexander ; Okabayashi, Norio ; Peronio, Angelo ; Giessibl, Franz J. ; Paulsson, Magnus

Analysis of STM images with pure and CO-functionalized tips: A first-principles and experimental study

Gustafsson, Alexander, Okabayashi, Norio, Peronio, Angelo, Giessibl, Franz J. und Paulsson, Magnus (2017) Analysis of STM images with pure and CO-functionalized tips: A first-principles and experimental study. Physical Review B 96 (8).

Veröffentlichungsdatum dieses Volltextes: 20 Mrz 2019 13:02
Artikel
DOI zum Zitieren dieses Dokuments: 10.5283/epub.39266


Zusammenfassung

We describe a first-principles method to calculate scanning tunneling microscopy (STM) images, and compare the results to well-characterized experiments combining STM with atomic force microscopy (AFM). The theory is based on density functional theory with a localized basis set, where the wave functions in the vacuum gap are computed by propagating the localized-basis wave functions into the gap ...

We describe a first-principles method to calculate scanning tunneling microscopy (STM) images, and compare the results to well-characterized experiments combining STM with atomic force microscopy (AFM). The theory is based on density functional theory with a localized basis set, where the wave functions in the vacuum gap are computed by propagating the localized-basis wave functions into the gap using a real-space grid. Constant-height STM images are computed using Bardeen's approximation method, including averaging over the reciprocal space. We consider copper adatoms and single CO molecules adsorbed on Cu(111), scanned with a single-atom copper tip with and without CO functionalization. The calculated images agree with state-of-the-art experiments, where the atomic structure of the tip apex is determined by AFM. The comparison further allows for detailed interpretation of the STM images.



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Details

DokumentenartArtikel
Titel eines Journals oder einer ZeitschriftPhysical Review B
Verlag:AMER PHYSICAL SOC
Ort der Veröffentlichung:COLLEGE PK
Band:96
Nummer des Zeitschriftenheftes oder des Kapitels:8
Datum2017
InstitutionenPhysik > Institut für Experimentelle und Angewandte Physik > Lehrstuhl Professor Giessibl > Arbeitsgruppe Franz J. Giessibl
Identifikationsnummer
WertTyp
10.1103/PhysRevB.96.085415DOI
Stichwörter / KeywordsSCANNING TUNNELING MICROSCOPE; ATOMIC-FORCE MICROSCOPY; EFFICIENT METHOD; WORK FUNCTION; SIMULATION; SURFACE; RESOLUTION; ELEMENTS;
Dewey-Dezimal-Klassifikation500 Naturwissenschaften und Mathematik > 530 Physik
StatusVeröffentlicht
BegutachtetJa, diese Version wurde begutachtet
An der Universität Regensburg entstandenJa
URN der UB Regensburgurn:nbn:de:bvb:355-epub-392662
Dokumenten-ID39266

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