| Veröffentlichte Version Download ( PDF | 2MB) |
Analysis of STM images with pure and CO-functionalized tips: A first-principles and experimental study
Gustafsson, Alexander, Okabayashi, Norio, Peronio, Angelo, Giessibl, Franz J. und Paulsson, Magnus (2017) Analysis of STM images with pure and CO-functionalized tips: A first-principles and experimental study. Physical Review B 96 (8).Veröffentlichungsdatum dieses Volltextes: 20 Mrz 2019 13:02
Artikel
DOI zum Zitieren dieses Dokuments: 10.5283/epub.39266
Zusammenfassung
We describe a first-principles method to calculate scanning tunneling microscopy (STM) images, and compare the results to well-characterized experiments combining STM with atomic force microscopy (AFM). The theory is based on density functional theory with a localized basis set, where the wave functions in the vacuum gap are computed by propagating the localized-basis wave functions into the gap ...
We describe a first-principles method to calculate scanning tunneling microscopy (STM) images, and compare the results to well-characterized experiments combining STM with atomic force microscopy (AFM). The theory is based on density functional theory with a localized basis set, where the wave functions in the vacuum gap are computed by propagating the localized-basis wave functions into the gap using a real-space grid. Constant-height STM images are computed using Bardeen's approximation method, including averaging over the reciprocal space. We consider copper adatoms and single CO molecules adsorbed on Cu(111), scanned with a single-atom copper tip with and without CO functionalization. The calculated images agree with state-of-the-art experiments, where the atomic structure of the tip apex is determined by AFM. The comparison further allows for detailed interpretation of the STM images.
Alternative Links zum Volltext
Beteiligte Einrichtungen
Details
| Dokumentenart | Artikel | ||||
| Titel eines Journals oder einer Zeitschrift | Physical Review B | ||||
| Verlag: | AMER PHYSICAL SOC | ||||
|---|---|---|---|---|---|
| Ort der Veröffentlichung: | COLLEGE PK | ||||
| Band: | 96 | ||||
| Nummer des Zeitschriftenheftes oder des Kapitels: | 8 | ||||
| Datum | 2017 | ||||
| Institutionen | Physik > Institut für Experimentelle und Angewandte Physik > Lehrstuhl Professor Giessibl > Arbeitsgruppe Franz J. Giessibl | ||||
| Identifikationsnummer |
| ||||
| Stichwörter / Keywords | SCANNING TUNNELING MICROSCOPE; ATOMIC-FORCE MICROSCOPY; EFFICIENT METHOD; WORK FUNCTION; SIMULATION; SURFACE; RESOLUTION; ELEMENTS; | ||||
| Dewey-Dezimal-Klassifikation | 500 Naturwissenschaften und Mathematik > 530 Physik | ||||
| Status | Veröffentlicht | ||||
| Begutachtet | Ja, diese Version wurde begutachtet | ||||
| An der Universität Regensburg entstanden | Ja | ||||
| URN der UB Regensburg | urn:nbn:de:bvb:355-epub-392662 | ||||
| Dokumenten-ID | 39266 |
Downloadstatistik
Downloadstatistik