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Low noise current preamplifier for qPlus sensor deflection signal detection in atomic force microscopy at room and low temperatures

Huber, Ferdinand ; Giessibl, Franz J.


The resolution of frequency modulation atomic force microscopy is limited by instrumental noise. When using a qPlus sensor, the deflection detector noise is the dominant noise contribution. It can be reduced by improving the preamplifier used to amplify the sensor deflection signal. We present a simple single-stage differential preamplifier which outperforms previous designs known to us by at ...


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