A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data

URN to cite this document:: urn:nbn:de:bvb:355-epub-406435
DOI to cite this document:: 10.5283/epub.40643

Seeholzer, Theresa ; Gretz, Oliver ; Giessibl, Franz J.

; Weymouth, Alfred J.

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Date of publication of this fulltext: 06 Aug 2019 13:28

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Abstract

One mode of atomic force microscopy (AFM) is frequency-modulation AFM, in which the tip is driven to oscillate at its resonance frequency which changes as the tip interacts with the surface. Frequency-modulation lateral force microscopy (FM-LFM) is the variant of this technique in which the tip is oscillated along the surface. For an isolated adsorbate on a flat surface, the only signal in FM-LFM ...