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A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data

Seeholzer, Theresa , Gretz, Oliver , Giessibl, Franz J. and Weymouth, Alfred J. (2019) A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data. New Journal of Physics 21 (8), 083007.

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Date of publication of this fulltext: 06 Aug 2019 13:28

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Other URL: http://doi.org/10.1088/1367-2630/ab3353


Abstract

One mode of atomic force microscopy (AFM) is frequency-modulation AFM, in which the tip is driven to oscillate at its resonance frequency which changes as the tip interacts with the surface. Frequency-modulation lateral force microscopy (FM-LFM) is the variant of this technique in which the tip is oscillated along the surface. For an isolated adsorbate on a flat surface, the only signal in FM-LFM ...

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Item type:Article
Date:5 August 2019
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:Open Access Publizieren (DFG)
Identification Number:
ValueType
10.1088/1367-2630/ab3353DOI
Keywords:atomic force microscopy, lateral force microscopy, Pt(111), frequency-modulation lateral force microscopy (FM-LFM), force deconvolution
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:40643
Owner only: item control page

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