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Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions

Pürckhauer, Korbinian ; Maier, Simon ; Merkel, Anja ; Kirpal, Dominik ; Giessibl, Franz J.



Zusammenfassung

Performing atomic force microscopy (AFM) and scanning tunneling microscopy (STM) with atomic resolution under ambient conditions is challenging due to enhanced noise and thermal drift. We show the design of a compact combined atomic force and scanning tunneling microscope that uses qPlus sensors and discuss the stability and thermal drift. By using a material with a low thermal expansion ...

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