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Experimental use of the inflection point test for force deconvolution in frequency-modulation atomic force microscopy to turn an ill-posed situation into a well-posed one by proper choice of amplitude

Huber, Ferdinand ; Giessibl, Franz J.



Abstract

Frequency-modulation atomic force microscopy allows one to measure the force between a sharp tip and a sample and, ultimately, the force between two single atoms with outstanding precision. To extract forces from the measured frequency shifts, a deconvolution algorithm is required. Mathematically, the deconvolution problem is an inversion problem. It has been shown that deconvolution can be ...

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