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- URN to cite this document:
- urn:nbn:de:bvb:355-epub-509630
- DOI to cite this document:
- 10.5283/epub.50963
Abstract
It's hard to imagine that we can take a splinter and sharpen it down to the atomic level. It's even more impressive that we can bring this sharp tip close to a surface, scan it over the surface, and be sensitive to the tiny forces between the apex atom and individual atoms on the surface. Measuring and interpreting these forces is the goal of high-resolution atomic force microscopy (AFM). We ...
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