Abstract
Lateral Force Microscopy (LFM), a variant of Atomic Force Microscopy (AFM), is well-suited for quantifying in-plane forces near an adsorbed molecule. Understanding these forces is crucial for understanding processes like adsorption, friction, and molecular self-assembly. Approaching closer to the sides of adsorbates requires careful consideration of the interaction with the tip. Notably, LFM ...
Abstract
Lateral Force Microscopy (LFM), a variant of Atomic Force Microscopy (AFM), is well-suited for quantifying in-plane forces near an adsorbed molecule. Understanding these forces is crucial for understanding processes like adsorption, friction, and molecular self-assembly. Approaching closer to the sides of adsorbates requires careful consideration of the interaction with the tip. Notably, LFM enables the direct imaging of hydrogen atoms at the sides of planar molecules, despite their small size, by detecting lateral forces and short-range interaction with unprecedented resolution [1]. This capability is particularly significant for studying hydrogen bonds, where the presence and position of hydrogen atoms influence molecular interactions. The findings demonstrate LFM’s potential to enhance the understanding of in-plane molecular interactions, paving the way for advancements in nanotechnology and materials science.