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Lateral Force Microscopy to study in-plane interactions next to adsorbed molecules

Nam, Shinjae ; Weymouth, Alfred J. ; Giessibl, Franz J.



Abstract

Lateral Force Microscopy (LFM), a variant of Atomic Force Microscopy (AFM), is well-suited for quantifying in-plane forces near an adsorbed molecule. Understanding these forces is crucial for understanding processes like adsorption, friction, and molecular self-assembly. Approaching closer to the sides of adsorbates requires careful consideration of the interaction with the tip. Notably, LFM ...

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