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Publications by Avramescu, A.

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Mohajerani, M. S., Khachadorian, S., Schimpke, T., Nenstiel, C., Hartmann, J., Ledig, J., Avramescu, A., Strassburg, M., Hoffmann, A. and Waag, A. (2016) Evaluation of local free carrier concentrations in individual heavily-doped GaN:Si micro-rods by micro-Raman spectroscopy. Applied Physics Letters 108 (9), 091112. Fulltext not available.

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