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Influence of short-range ordering on roughness of (AlGa)As interfaces studied with cross-sectional scanning tunneling microscopy

Reusch, T. C. G., Wenderoth, M., Heinrich, A. J., Engel, K. J., Quaas, N., Sauthoff, K., Ulbrich, R. G., Weber, E. R., Uchida, K. and Wegscheider, Werner (2000) Influence of short-range ordering on roughness of (AlGa)As interfaces studied with cross-sectional scanning tunneling microscopy. Applied Physics Letters 76 (28), pp. 3882-3883.

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Abstract

Cross-sectional scanning tunneling microscopy was used to identify individual Al atoms on cleaved surfaces of two sets of (AlGa)As heterostructure samples grown with metalorganic vapor-phase epitaxy and molecular-beam epitaxy. We determined the average Al concentration profile perpendicular to the GaAs–(AlGa)As interfaces. Based on former investigations of short-range ordering in (AlGa)As bulk ...

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Item type:Article
Date:26 June 2000
Institutions:Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider
Interdisciplinary Subject Network:Not selected
Identification Number:
ValueType
10.1063/1.126808DOI
Related URLs:
URLURL Type
http://link.aip.org/link/?APPLAB/76/3882/1Publisher
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Item ID:11051
Owner only: item control page

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