Scanning gate measurements on a quantum wire

DOI to cite this document:: 10.5283/epub.11306

Ihn, Thomas ; Rychen, J. ; Cilento, T. ; Held, R. ; Ensslin, Klaus ; Wegscheider, Werner ; Bichler, Max

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Date of publication of this fulltext: 07 Dec 2009 13:09

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Abstract

We have performed measurements on a semiconductor quantum wire in which we induce a local potential perturbation with the metallic tip of a scanning force microscope. Measurement of the sample resistance as a function of tip position results in an electrical map of the wire in real space. We find the fingerprint of potential fluctuations in the wire which appear as local resistance fluctuations ...