Go to content
UR Home

Scanning gate measurements on a quantum wire

DOI to cite this document:
10.5283/epub.11306
Ihn, Thomas ; Rychen, J. ; Cilento, T. ; Held, R. ; Ensslin, Klaus ; Wegscheider, Werner ; Bichler, Max
[img]PDF
(109kB) - Repository staff only
Date of publication of this fulltext: 07 Dec 2009 13:09


Abstract

We have performed measurements on a semiconductor quantum wire in which we induce a local potential perturbation with the metallic tip of a scanning force microscope. Measurement of the sample resistance as a function of tip position results in an electrical map of the wire in real space. We find the fingerprint of potential fluctuations in the wire which appear as local resistance fluctuations ...

plus


Owner only: item control page
  1. Homepage UR

University Library

Publication Server

Contact:

Publishing: oa@ur.de
0941 943 -4239 or -69394

Dissertations: dissertationen@ur.de
0941 943 -3904

Research data: datahub@ur.de
0941 943 -5707

Contact persons