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Kelvin probe spectroscopy of a two-dimensional electron gas below 300 mK

DOI to cite this document:
Vancura, T. ; Kicin, S. ; Ihn, Thomas ; Ensslin, Klaus ; Bichler, Max ; Wegscheider, Werner
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Date of publication of this fulltext: 15 Dec 2009 08:58


A scanning force microscope with a base temperature below 300 mK is used for measuring the local electron density of a two-dimensional electron gas embedded in a Ga[Al]As heterostructure. At different separations between atomic force microscope tip and sample, a dc voltage is applied between the tip and the electron gas while simultaneously recording the frequency shift of the oscillating tip. ...


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