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Scanning a metallic tip close to a quantum point contact

Pioda, A., Brunner, D., Kicin, S., Ihn, Thomas, Sigrist, Martin, Fuhrer, A., Ensslin, Klaus, Reinwald, Matthias and Wegscheider, Werner (2006) Scanning a metallic tip close to a quantum point contact. Physica E Low-dimensional Systems and Nanostructures 32 (1-2), pp. 167-170.

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Abstract

Low-temperature transport experiments on a quantum point contact under the influence of a scanning gate are reported. The scanning gate is the metallic tip of a scanning force microscope operating at a temperature of 300 mK. In particular, the influence of the scanning tip on conductance resonances observed in the gate-characteristics of the point contact is studied. The strongest conductance ...

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Item type:Article
Date:May 2006
Institutions:Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider
Identification Number:
ValueType
10.1016/j.physe.2005.12.124DOI
Classification:
NotationType
07.20.Mc; 73.63.−bPACS
Keywords:Scanning probe microscopy; Scanning-gate microscopy; Quantum point contact
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Item ID:12190
Owner only: item control page

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