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Pioda, A. ; Brunner, D. ; Kicin, S. ; Ihn, Thomas ; Sigrist, Martin ; Fuhrer, A. ; Ensslin, Klaus ; Reinwald, Matthias ; Wegscheider, Werner

Scanning a metallic tip close to a quantum point contact

Pioda, A., Brunner, D., Kicin, S., Ihn, Thomas, Sigrist, Martin, Fuhrer, A., Ensslin, Klaus, Reinwald, Matthias and Wegscheider, Werner (2006) Scanning a metallic tip close to a quantum point contact. Physica E Low-dimensional Systems and Nanostructures 32 (1-2), pp. 167-170.

Date of publication of this fulltext: 25 Jan 2010 13:14
Article
DOI to cite this document: 10.5283/epub.12190


Abstract

Low-temperature transport experiments on a quantum point contact under the influence of a scanning gate are reported. The scanning gate is the metallic tip of a scanning force microscope operating at a temperature of 300 mK. In particular, the influence of the scanning tip on conductance resonances observed in the gate-characteristics of the point contact is studied. The strongest conductance ...

Low-temperature transport experiments on a quantum point contact under the influence of a scanning gate are reported. The scanning gate is the metallic tip of a scanning force microscope operating at a temperature of 300 mK. In particular, the influence of the scanning tip on conductance resonances observed in the gate-characteristics of the point contact is studied. The strongest conductance resonances appear to be related to the local potential within the channel of the point contact. As a consequence, the point contact with its conductance resonances can be used as a sensor for the local tip-induced potential.



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Details

Item typeArticle
Journal or Publication TitlePhysica E Low-dimensional Systems and Nanostructures
Publisher:Elsevier
Volume:32
Number of Issue or Book Chapter:1-2
Page Range:pp. 167-170
DateMay 2006
InstitutionsPhysics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider
Identification Number
ValueType
10.1016/j.physe.2005.12.124DOI
Classification
NotationType
07.20.Mc; 73.63.−bPACS
KeywordsScanning probe microscopy; Scanning-gate microscopy; Quantum point contact
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedUnknown
Created at the University of RegensburgUnknown
Item ID12190

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