Detection of magnetic circular dichroism on the two-nanometer scale

URN to cite this document:: urn:nbn:de:bvb:355-epub-136555
DOI to cite this document:: 10.5283/epub.13655

Schattschneider, Peter ; Stöger-Pollach, Michael ; Rubino, Stefano ; Sperl, Matthias ; Hurm, Christian ; Zweck, Josef ; Rusz, Ján

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Date of publication of this fulltext: 22 Mar 2010 07:23

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Item type:	Article
Open Access Type:	Due to SHERPA/RoMEO
Journal or Publication Title:	Physical Review B (PRB)
Publisher:	American Physical Society
Volume:	78
Number of Issue or Book Chapter:	10
Page Range:	p. 104413
Date:	18 September 2008
Institutions:	Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Chair Professor Back > Group Christian Back Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Günther Bayreuther Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Chair Professor Back > Group Josef Zweck
Dewey Decimal Classification:	500 Science > 530 Physics
Status:	Published
Refereed:	Yes, this version has been refereed
Created at the University of Regensburg:	Partially
Item ID:	13655

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Abstract

Magnetic circular dichroism (MCD) is a standard technique for the study of magnetic properties of materials in synchrotron beamlines. We present here a scattering geometry in the transmission electron microscope through which MCD can be observed with unprecedented spatial resolution. A convergent electron beam is used to scan a cross sectional preparation of a Fe/Au multilayer sample. Differences ...

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