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- URN to cite this document:
- urn:nbn:de:bvb:355-epub-149353
- DOI to cite this document:
- 10.5283/epub.14935
Alternative links to fulltext:DOI
Abstract
We present vector network analyzer ferromagnetic resonance measurements of epitaxial Fe films having a thickness of 16 monolayers. Our objective is to test the reliability of this novel frequency domain technique with respect to frequency and damping. For this purpose we compare vector network analyzer ferromagnetic resonance to pulsed inductive microwave magnetometry, time resolved magnetooptic ...

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