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Nonlinear optical probing of nanocrystalline orientation in epitaxial ferroelectric thin films

Woltersdorf, Georg, Seifert, G, Graener, H, Pignolet, A and Hesse, D (2002) Nonlinear optical probing of nanocrystalline orientation in epitaxial ferroelectric thin films. Journal of Applied Physics 91 (1), pp. 362-366.

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Abstract

Epitaxially grown ferroelectric BaBi4Ti4O15 thin films were studied by optical second-harmonic (SH) generation using a femtosecond titanium:sapphire laser at 800 nm wavelength. By varying both the incidence and the azimuthal angle and registering the second-harmonic intensity, a significant correlation was found between the azimuthal dependence of the measured SH signal and the ...

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Item type:Article
Date:January 2002
Institutions:UNSPECIFIED
Identification Number:
ValueType
10.1063/1.1420764DOI
Classification:
NotationType
77.80.-ePACS
77.84.EkPACS
77.84.CgPACS
77.55.-gPACS
42.65.KyPACS
78.66.NkPACS
Keywords:barium compounds, bismuth compounds, ferroelectric materials, ferroelectric thin films, optical harmonic generation, X-ray diffraction, electron microscopy
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Item ID:14954
Owner only: item control page

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