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Dötzer, R. ; Friedland, K. J. ; Hey, R. ; Kostial, H. ; Miehling, H. ; Schoepe, Wilfried

Low-temperature electronic transport measurements on a gated delta -doped GaAs sample: magnetoresistance, quantum Hall effect and conductivity fluctuations

Dötzer, R., Friedland, K. J., Hey, R., Kostial, H., Miehling, H. und Schoepe, Wilfried (1994) Low-temperature electronic transport measurements on a gated delta -doped GaAs sample: magnetoresistance, quantum Hall effect and conductivity fluctuations. Semiconductor Science and Technology 9 (7), S. 1332-1339.

Veröffentlichungsdatum dieses Volltextes: 17 Dez 2010 07:11
Artikel
DOI zum Zitieren dieses Dokuments: 10.5283/epub.18802


Zusammenfassung

We present magnetotransport measurements (up to 7 T) performed at very low temperatures (down to 20 mK) on a GaAs sample containing two parallel delta -doped layers whose carrier concentration can be varied by means of a gate electrode. With increasing negative gate voltage the resistance becomes more strongly temperature-dependent, indicating a more localized electron system. The ...

We present magnetotransport measurements (up to 7 T) performed at very low temperatures (down to 20 mK) on a GaAs sample containing two parallel delta -doped layers whose carrier concentration can be varied by means of a gate electrode. With increasing negative gate voltage the resistance becomes more strongly temperature-dependent, indicating a more localized electron system. The magnetoresistance is found to be strongly anisotropic. When the field is parallel to the layers we find a large positive magnetoresistance which we attribute to orbital shrinking of the strongly localized donor wavefunction. In contrast, in the perpendicular orientation, we observe a strong negative magnetoresistance at low fields whose origin remains unclear, and the quantum Hall effect at larger fields. At low gate voltages both delta -layers are in the quantum Hall state whereas at larger negative voltages the layer adjacent to the gate becomes insulating. In the case of strong depletion the high-ohmic sample shows reproducible conductivity fluctuations as a function of either the gate voltage or the magnetic field. The fluctuations diminish at higher temperatures and larger measuring currents.



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Details

DokumentenartArtikel
Titel eines Journals oder einer ZeitschriftSemiconductor Science and Technology
Verlag:IOP Publ. (= Institute of Physics)
Band:9
Nummer des Zeitschriftenheftes oder des Kapitels:7
Seitenbereich:S. 1332-1339
Datum1994
InstitutionenPhysik > Institut für Experimentelle und Angewandte Physik > Entpflichtete oder im Ruhestand befindliche Professoren > Prof. Wilfried Schoepe
Identifikationsnummer
WertTyp
10.1088/0268-1242/9/7/006DOI
Klassifikation
NotationArt
72.20.My Galvanomagnetic and other magnetotransport effectsPACS
73.43.Qt MagnetoresistancePACS
72.80.Ey III-V and II-VI semiconductorsPACS
Dewey-Dezimal-Klassifikation500 Naturwissenschaften und Mathematik > 530 Physik
StatusVeröffentlicht
BegutachtetUnbekannt / Keine Angabe
An der Universität Regensburg entstandenUnbekannt / Keine Angabe
URN der UB Regensburgurn:nbn:de:bvb:355-epub-188020
Dokumenten-ID18802

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