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Haug, Thomas ; Back, Christian ; Raabe, Jörg ; Heun, S. ; Locatelli, A.

Magnetic domain walls in T-shaped permalloy microstructures

Haug, Thomas, Back, Christian , Raabe, Jörg , Heun, S. and Locatelli, A. (2005) Magnetic domain walls in T-shaped permalloy microstructures. Applied Physics Letters 86, p. 152503.

Date of publication of this fulltext: 05 Aug 2009 13:34
Article
DOI to cite this document: 10.5283/epub.1924


Abstract

The magnetic domain wall width of T-shaped permalloy structures has been measured using a photoemission electron microscope and x-ray magnetic dichroism. The results are compared to micromagnetic simulations. The shape of the structures allows us to analyze 90 degrees Neel walls. We find a decrease in domain wall width with decreasing contact dimensions as expected by theory and in good agreement with our micromagnetic simulations. (C) 2005 American Institute of Physics.



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Details

Item typeArticle
Journal or Publication TitleApplied Physics Letters
Publisher:AMER INST PHYSICS
Place of Publication:MELVILLE
Volume:86
Page Range:p. 152503
DateApril 2005
InstitutionsPhysics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Chair Professor Back > Group Christian Back
Identification Number
ValueType
10.1063/1.1897059DOI
KeywordsMAGNETORESISTANCE;
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedYes, this version has been refereed
Created at the University of RegensburgYes
Item ID1924

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