Ionization of impurities in semiconductors by intense FIR radiation
Ganichev, Sergey (2003) Ionization of impurities in semiconductors by intense FIR radiation. In: Svechnikov, Sergey V. and Valakh, Mikhail Y., (eds.) Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics. Proceedings of SPIE, 5024. SPIE, Bellingham, Washington, pp. 12-23. ISBN 0819448257; 9780819448255.Date of publication of this fulltext: 05 Aug 2009 13:37
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| Item type | Book section | ||||
| ISBN | 0819448257; 9780819448255 | ||||
| Journal or Publication Title | Proceedings of SPIE | ||||
| Title of Book: | Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics | ||||
|---|---|---|---|---|---|
| Publisher: | SPIE | ||||
| Place of Publication: | Bellingham, Washington | ||||
| Other Series: | Proceedings of SPIE | ||||
| Volume: | 5024 | ||||
| Page Range: | pp. 12-23 | ||||
| Date | April 2003 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Professor Ganichev > Group Sergey Ganichev | ||||
| Identification Number |
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| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Yes, this version has been refereed | ||||
| Created at the University of Regensburg | Yes | ||||
| Item ID | 2177 |
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