Owner only: item control page
Ionization of impurities in semiconductors by intense FIR radiation
Ganichev, Sergey (2003) Ionization of impurities in semiconductors by intense FIR radiation. In: Svechnikov, Sergey V. and Valakh, Mikhail Y., (eds.) Selected papers on optics and photonics: optical diagnostics of materials and devices for opto-, micro-, and quantum electronics. SPIE proceedings series, 5024. SPIE, Bellingham, Washington, pp. 12-23. ISBN 0-8194-4825-7.Date of publication of this fulltext: 05 Aug 2009 13:37
Book section
Alternative links to fulltext
Involved Institutions
Details
| Item type | Book section | ||||
| ISBN | 0-8194-4825-7 | ||||
| Journal or Publication Title | in Optical Diagnostic of Materials and Devices for Opto-, Micro- and Quantum Electronics, S. V. Svechnikov and M. Y. Valakh (eds.) | ||||
| Title of Book: | Selected papers on optics and photonics: optical diagnostics of materials and devices for opto-, micro-, and quantum electronics | ||||
|---|---|---|---|---|---|
| Publisher: | SPIE | ||||
| Place of Publication: | Bellingham, Washington | ||||
| Other Series: | SPIE proceedings series | ||||
| Volume: | 5024 | ||||
| Page Range: | pp. 12-23 | ||||
| Date | April 2003 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Professor Ganichev > Group Sergey Ganichev | ||||
| Identification Number |
| ||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Yes, this version has been refereed | ||||
| Created at the University of Regensburg | Yes | ||||
| Item ID | 2211 |
Export bibliographical data
Owner only: item control page
Altmetric
Altmetric