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Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations

URN to cite this document:
urn:nbn:de:bvb:355-epub-253411
Giessibl, Franz J. ; Bielefeldt, Hartmut ; Hembacher, Stefan ; Mannhart, Jochen
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Date of publication of this fulltext: 13 Jul 2012 08:03


Abstract

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7 × 7) surface is studied ...

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