Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations - University of Regensburg Publication Server

URN to cite this document:: urn:nbn:de:bvb:355-epub-253411

Giessibl, Franz J. ; Bielefeldt, Hartmut ; Hembacher, Stefan ; Mannhart, Jochen

Preview

PDF
(1MB)

Date of publication of this fulltext: 13 Jul 2012 08:03

Alternative links to fulltext:DOI

Details

Preview

Export bibliographical data

Abstract

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7 × 7) surface is studied ...