Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan and Mannhart, Jochen
(2001)
Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations.
Annalen der Physik 10 (11-12), pp. 887-910.
Date of publication of this fulltext: 13 Jul 2012 08:03at publisher (via DOI)
Abstract
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7 × 7) surface is studied ...
Abstract
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7 × 7) surface is studied by AFM with various tips and AFM images are simulated with chemical and electrostatic model forces. The calculation of images from the tip-sample forces is explained in detail and the implications of the imaging parameters are discussed. Because the structure of the Si(111)-(7 × 7) surface is known very well, the shape of the adatom images is used to determine the tip structure. The observability of atomic orbitals by AFM and scanning tunneling microscopy is discussed.
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