Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations - University of Regensburg Publication Server

URN to cite this document:: urn:nbn:de:bvb:355-epub-253411
DOI to cite this document:: 10.5283/epub.25341

Giessibl, Franz J. ; Bielefeldt, Hartmut ; Hembacher, Stefan ; Mannhart, Jochen

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Date of publication of this fulltext: 13 Jul 2012 08:03

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Abstract

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7 × 7) surface is studied ...