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Haug, Thomas ; Vogl, Anton ; Zweck, Josef ; Back, Christian

In situ measurements of magnetoresistive effects in ferromagnetic microstructures by Lorentz microscopy

Haug, Thomas, Vogl, Anton, Zweck, Josef and Back, Christian (2006) In situ measurements of magnetoresistive effects in ferromagnetic microstructures by Lorentz microscopy. Applied Physics Letters 88, 082506.

Date of publication of this fulltext: 26 Oct 2011 07:14
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Item typeArticle
Journal or Publication TitleApplied Physics Letters
Publisher:AMER INST PHYSICS
Place of Publication:MELVILLE
Volume:88
Page Range:082506
Date2006
InstitutionsPhysics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Chair Professor Back > Group Christian Back
Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Chair Professor Back > Group Josef Zweck
Identification Number
ValueType
10.1063/1.2179367DOI
KeywordsBALLISTIC MAGNETORESISTANCE; ELECTRON-MICROSCOPY;
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedYes, this version has been refereed
Created at the University of RegensburgYes
Item ID2551

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