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Interface magnetization profiling by x-ray magnetometry of marker impurities on Fe/GaAs(001)-(4x6)
Giovanelli, L., Panaccione, G., Rossi, G., Fabrizioli, M., Tian, C., Gastelois, P., Fujii, J. and Back, Christian (2005) Interface magnetization profiling by x-ray magnetometry of marker impurities on Fe/GaAs(001)-(4x6). Applied Physics Letters 87, 042506.Date of publication of this fulltext: 05 Aug 2009 13:40
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| Item type | Article |
| Journal or Publication Title | Applied Physics Letters |
| Publisher: | American Institute of Physics |
|---|---|
| Volume: | 87 |
| Page Range: | 042506 |
| Date | 2005 |
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Chair Professor Back > Group Christian Back |
| Dewey Decimal Classification | 500 Science > 530 Physics |
| Status | Published |
| Refereed | Yes, this version has been refereed |
| Created at the University of Regensburg | Yes |
| Item ID | 2552 |
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