Theory of scanning gate microscopy

URN to cite this document:: urn:nbn:de:bvb:355-epub-310727
DOI to cite this document:: 10.5283/epub.31072

Gorini, Cosimo ; Jalabert, Rodolfo A. ; Szewc, Wojciech ; Tomsovic, Steven ; Weinmann, Dietmar

Preview

PDF
(1MB)

Preview

PDF
(1MB)

Date of publication of this fulltext: 14 Jan 2015 06:35

Alternative links to fulltext:DOI Arxiv

Details

Preview

Export bibliographical data

Abstract

A systematic theory of the conductance measurements of noninvasive (weak probe) scanning gate microscopy is presented that provides an interpretation of what precisely is being measured. A scattering approach is used to derive explicit expressions for the first- and second-order conductance changes due to the perturbation by the tip potential in terms of the scattering states of the unperturbed ...