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Optical Constants Measurements of Single-Layer Thin Films on TransparentSubstrates,
Penzkofer, Alfons, Drotleff, E. and Holzer, W. (1998) Optical Constants Measurements of Single-Layer Thin Films on TransparentSubstrates,. Optics Communications 158, pp. 221-230.Date of publication of this fulltext: 05 Aug 2009 13:45
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| Item type | Article |
| Journal or Publication Title | Optics Communications |
| Volume: | 158 |
|---|---|
| Page Range: | pp. 221-230 |
| Date | 1998 |
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Alfons Penzkofer |
| Dewey Decimal Classification | 500 Science > 530 Physics |
| Status | Published |
| Refereed | Yes, this version has been refereed |
| Created at the University of Regensburg | Yes |
| Item ID | 3892 |
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