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Penzkofer, Alfons ; Drotleff, E. ; Holzer, W.

Optical Constants Measurements of Single-Layer Thin Films on TransparentSubstrates,

Penzkofer, Alfons, Drotleff, E. and Holzer, W. (1998) Optical Constants Measurements of Single-Layer Thin Films on TransparentSubstrates,. Optics Communications 158, pp. 221-230.

Date of publication of this fulltext: 05 Aug 2009 13:45
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Item typeArticle
Journal or Publication TitleOptics Communications
Volume:158
Page Range:pp. 221-230
Date1998
InstitutionsPhysics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Alfons Penzkofer
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedYes, this version has been refereed
Created at the University of RegensburgYes
Item ID3892

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