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Optical Constants Measurements of Single-Layer Thin Films on TransparentSubstrates,

Penzkofer, Alfons, Drotleff, E. and Holzer, W. (1998) Optical Constants Measurements of Single-Layer Thin Films on TransparentSubstrates,. Optics Communications 158, pp. 221-230.

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Item type:Article
Date:1998
Institutions:Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Alfons Penzkofer
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:3892
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