Quantifying nanoscale electromagnetic fields in near-field microscopy by Fourier demodulation analysis

DOI to cite this document:: 10.5283/epub.41573

Mooshammer, Fabian

; Huber, Markus A. ; Sandner, Fabian ; Plankl, Markus ; Zizlsperger, Martin ; Huber, Rupert

Date of publication of this fulltext: 13 Feb 2020 08:34

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Abstract

Confining light to sharp metal tips has become a versatile technique to study optical and electronic properties far below the diffraction limit. Particularly near-field microscopy in the mid-infrared spectral range has found a variety of applications in probing nanostructures and their dynamics. Yet, the ongoing quest for ultimately high spatial resolution down to the single-nanometer regime and ...