Data archive of "Quantifying Nanoscale Electromagnetic Fields in Near-Field Microscopy by Fourier Demodulation Analysis"

Name: Data archive of "Quantifying Nanoscale Electromagnetic Fields in Near-Field Microscopy by Fourier Demodulation Analysis"
Published: 2020
Keywords: ANALYTICAL-MODEL; SPECTROSCOPY; ULTRAFAST; POLARITONS; ABSORPTION; NANOWIRES; PROBES; TIP; scattering-type SNOM; mid-infrared; nanoscopy; tomography; finite element method; demodulated fields, 530 Physics

DOI to cite this document:: 10.5283/epub.43818

Mooshammer, Fabian

; Huber, Markus A. ; Sandner, Fabian ; Plankl, Markus ; Zizlsperger, Martin ; Huber, Rupert

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Date of publication of this fulltext: 28 Sep 2020 07:18

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Abstract

Confining light to sharp metal tips has become a versatile technique to study optical and electronic properties far below the diffraction limit. Particularly near-field microscopy in the mid-infrared spectral range has found a variety of applications in probing nanostructures and their dynamics. Yet, the ongoing quest for ultimately high spatial resolution down to the single-nanometer regime and ...