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Data archive of "Quantifying Nanoscale Electromagnetic Fields in Near-Field Microscopy by Fourier Demodulation Analysis"

DOI to cite this document:
Mooshammer, Fabian ; Huber, Markus A. ; Sandner, Fabian ; Plankl, Markus ; Zizlsperger, Martin ; Huber, Rupert
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Date of publication of this fulltext: 28 Sep 2020 07:18


Confining light to sharp metal tips has become a versatile technique to study optical and electronic properties far below the diffraction limit. Particularly near-field microscopy in the mid-infrared spectral range has found a variety of applications in probing nanostructures and their dynamics. Yet, the ongoing quest for ultimately high spatial resolution down to the single-nanometer regime and ...


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