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- URN to cite this document:
- urn:nbn:de:bvb:355-epub-416836
- DOI to cite this document:
- 10.5283/epub.41683
Alternative links to fulltext:Publisher
Abstract
Raman spectroscopy is a precious tool for the characterization of van der Waals materials, e.g. for the determination of the layer number in thin exfoliated flakes. For sensitive materials, however, this method can be dramatically invasive. In particular, the light intensity required to obtain a significant Raman signal is sufficient to immediately photo-oxidize few-layer thick metallic van der ...

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