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Scheuerer, Philipp ; Patera, Laerte L. ; Repp, Jascha

Data for: "Manipulating and probing the distribution of excess electrons in an electrically-isolated self-assembled molecular structure"

Scheuerer, Philipp , Patera, Laerte L. and Repp, Jascha (2020) Data for: "Manipulating and probing the distribution of excess electrons in an electrically-isolated self-assembled molecular structure". [Dataset]

Date of publication of this fulltext: 15 Jun 2020 14:25
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DOI to cite this document: 10.5283/epub.41688


Abstract

Exploiting single electrical charges and their mutual interactions for computation has been proposed as a concept for future nanoelectronics. Controlling and probing charge transfer in electrically isolated atomic-scale structures are fundamental to push its experimental realization. Here, we controllably inject individual excess electrons and study their distribution in a self-assembled ...

Exploiting single electrical charges and their mutual interactions for computation has been proposed as a concept for future nanoelectronics. Controlling and probing charge transfer in electrically isolated atomic-scale structures are fundamental to push its experimental realization. Here, we controllably inject individual excess electrons and study their distribution in a self-assembled structure supported on a nonconductive substrate. The self-assembly ensures structural order down to the atomic scale. Depending on the charge state of the molecular assembly, intermolecular electron hopping and specific electron distributions have been resolved by atomic force microscopy, clarifying the charge-transfer pathways in the tunnel-coupled structure. 'When mutual charge interactions were exploited, control over specific charge distributions in the self-assembled structure has been achieved with single-molecule precision, paving the way toward the design of data processing platforms based on molecular nanostructures.



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Details

Item typeDataset
Journal or Publication TitleNano Letters
Publisher:AMER CHEMICAL SOC
Place of Publication:WASHINGTON
Volume:-
Page Range:Articles ASAP
Date20 February 2020
InstitutionsPhysics > Institute of Experimental and Applied Physics > Group Jascha Repp
Identification Number
ValueType
10.1021/acs.nanolett.9b05063DOI
KeywordsFORCE MICROSCOPY; CHARGE-STATE; PENTACENE; ENERGY; SENSOR; ATOM; atomic force microscopy; self-assembly; single-electron charging; dissipation
Dewey Decimal Classification500 Science > 530 Physics
500 Science > 540 Chemistry & allied sciences
StatusUnpublished
RefereedNo, this document will not be refereed
Created at the University of RegensburgYes
Item ID41688

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