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Determination of polarization fields in group III-nitride heterostructures by capacitance-voltage-measurements

Rychetsky, Monir ; Koslow, Ingrid ; Avinc, Baran ; Rass, Jens ; Wernicke, Tim ; Bellmann, Konrad ; Sulmoni, Luca ; Hoffmann, Veit ; Weyers, Markus ; Wild, Johannes ; Zweck, Josef ; Witzigmann, Bernd ; Kneissl, Michael



Abstract

The polarization fields in wurtzite group III-nitrides strongly influence the optical properties of InAlGaN-based light emitters, e.g., the electron and hole wave function overlap in quantum wells. In this paper, we propose a new approach to determine these fields by capacitance-voltage measurements (CVM). Sheet charges generated by a change of the microscopic polarization at heterointerfaces ...

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