Direkt zum Inhalt

Nippert, Felix ; Karpov, Sergey Yu. ; Callsen, Gordon ; Galler, Bastian ; Kure, Thomas ; Nenstiel, Christian ; Wagner, Markus R. ; Straßburg, Martin ; Lugauer, Hans-Jürgen ; Hoffmann, Axel

Temperature-dependent recombination coefficients in InGaN light-emitting diodes: Hole localization, Auger processes, and the green gap

Article

Nippert, Felix, Karpov, Sergey Yu., Callsen, Gordon, Galler, Bastian, Kure, Thomas, Nenstiel, Christian, Wagner, Markus R., Straßburg, Martin, Lugauer, Hans-Jürgen and Hoffmann, Axel (2016) Temperature-dependent recombination coefficients in InGaN light-emitting diodes: Hole localization, Auger processes, and the green gap. Applied Physics Letters 109 (16), p. 161103.



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    Details

    Item typeArticle
    Journal or Publication TitleApplied Physics Letters
    Volume109
    Number of Issue or Book Chapter16
    Page Rangep. 161103
    Date2016
    Date of publication17 Mar 2020 12:07
    InstitutionsUNSPECIFIED
    Identification Number
    ValueType
    10.1063/1.4965298DOI
    Dewey Decimal ClassificationUNSPECIFIED
    StatusPublished
    RefereedYes, this version has been refereed
    Created at the University of RegensburgYes
    Item ID42908

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