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High-precision atomic force microscopy with atomically-characterized tips

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DOI to cite this document:
Liebig, A. ; Peronio, A. ; Meuer, D. ; Weymouth, A. J. ; Giessibl, F. J.
License: Creative Commons Attribution 4.0
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Date of publication of this fulltext: 02 Nov 2020 11:15


Traditionally, atomic force microscopy (AFM) experiments are conducted at tip–sample distances where the tip strongly interacts with the surface. This increases the signal-to-noise ratio, but poses the problem of relaxations in both tip and sample that hamper the theoretical description of experimental data. Here, we employ AFM at relatively large tip–sample distances where forces are only on the ...


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