High-precision atomic force microscopy with atomically-characterized tips

URN to cite this document:: urn:nbn:de:bvb:355-epub-440317
DOI to cite this document:: 10.5283/epub.44031

Liebig, A.

; Peronio, A.

; Meuer, D. ; Weymouth, A. J.

; Giessibl, F. J.

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Date of publication of this fulltext: 02 Nov 2020 11:15

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Abstract

Traditionally, atomic force microscopy (AFM) experiments are conducted at tip–sample distances where the tip strongly interacts with the surface. This increases the signal-to-noise ratio, but poses the problem of relaxations in both tip and sample that hamper the theoretical description of experimental data. Here, we employ AFM at relatively large tip–sample distances where forces are only on the ...