| License: Creative Commons Attribution 4.0 PDF - Published Version (1MB) |
- URN to cite this document:
- urn:nbn:de:bvb:355-epub-447797
- DOI to cite this document:
- 10.5283/epub.44779
Abstract
A novel and cost-efficient probe fabrication method yielding probes for performing simultaneous scanning electrochemical microscopy (SECM) and scanning ion conductance microscopy (SICM) is presented. Coupling both techniques allows distinguishing topographical and electrochemical activity information obtained by SECM. Probes were prepared by deposition of photoresist onto platinum-coated, pulled ...

Owner only: item control page