Go to content
UR Home

Material contrast studies of conductive thin films on semiconductor substrates using scanning electrochemical microscopy

Hanekamp, Patrick ; Raith, Timo ; Iffelsberger, Christian ; Zankl, Tobias ; Robl, Werner ; Matysik, Frank-Michael


In this paper, a mediator-free scanning electrochemical microscopy (SECM) imaging concept is presented, which is capable of generating high electrochemical contrast and high spatial resolution between two conductive materials. The methodical approach is based on the hydrogen evolution reaction which shows potential dependent material selectivity. Various conductive thin films deposited on silicon ...


Owner only: item control page
  1. Homepage UR

University Library

Publication Server


Publishing: oa@ur.de
0941 943 -4239 or -69394

Dissertations: dissertationen@ur.de
0941 943 -3904

Research data: datahub@ur.de
0941 943 -5707

Contact persons