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Air tightness of hBN encapsulation and its impact on Raman spectroscopy of van der Waals materials

Holler, Johannes ; Bauriedl, Lorenz ; Korn, Tobias ; Seitz, Andrea ; Özyigit, Furkan ; Eichinger, Michaela ; Schüller, Christian ; Watanabe, Kenji ; Taniguchi, Takashi ; Strunk, Christoph ; Paradiso, Nicola


Raman spectroscopy is a precious tool for the characterization of van der Waals materials, e.g. for the determination of the layer number in thin exfoliated flakes. For sensitive materials, however, this method can be dramatically invasive. In particular, the light intensity required to obtain a significant Raman signal is sufficient to immediately photo-oxidize few-layer thick metallic van der ...


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