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The Stacking Faulted Nature of the Narrow Gap Semiconductor Sc2Si2Te6

Pielnhofer, Florian ; Bette, Sebastian ; Eger, Roland ; Duppel, Viola ; Nuss, Jürgen ; Dolle, Christian ; Dinnebier, Robert E. ; Lotsch, Bettina V.



Abstract

Crystals of Sc2Si2Te6 have been grown and its crystal, micro- and electronic structures were investigated. The layered character of the title compound exhibits stacking faults that impede a full structural characterization by single crystal X-ray diffraction due to diffuse scattering. Based on high resolution transmission electron micrographs and diffraction patterns, the stacking faulted nature ...

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