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All-optical subcycle microscopy on atomic length scales

URN to cite this document:
urn:nbn:de:bvb:355-epub-587700
DOI to cite this document:
10.5283/epub.58770
Siday, Tom ; Hayes, Johannes ; Schiegl, Felix ; Sandner, Fabian ; Menden, Peter ; Bergbauer, Valentin ; Zizlsperger, Martin ; Nerreter, Svenja ; Lingl, Sonja ; Repp, Jascha ; Wilhelm, Jan ; Huber, Markus A. ; Gerasimenko, Yaroslav A. ; Huber, Rupert
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Date of publication of this fulltext: 14 Aug 2024 06:22



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