![]() | PDF - Published Version (7MB) |
- URN to cite this document:
- urn:nbn:de:bvb:355-epub-747683
- DOI to cite this document:
- 10.5283/epub.74768
Abstract
The qPlus sensor allows for the simultaneous operation of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). When operating a combined qPlus sensor STM/AFM at large tunneling currents, a hitherto unexplained tunneling current-induced cross coupling can occur, which has already been observed decades ago. Here, we study this phenomenon both theoretically and experimentally; its ...

Owner only: item control page