Spin-polarized tunneling through randomly transparent magnetic junctions: Reentrant magnetoresistance approaching the Jullière limit

URN to cite this document:

urn:nbn:de:bvb:355-epub-77973 Copy

Tkachov, Grygoriy ; Richter, Klaus

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Date of publication of this fulltext: 05 Aug 2009 13:57

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Details

Item type:	Article
Journal or Publication Title:	Physical Review B (PRB)
Publisher:	American Physical Society
Volume:	77
Number of Issue or Book Chapter:	18
Page Range:	p. 184427
Date:	23 May 2008
Institutions:	Physics > Institute of Theroretical Physics > Chair Professor Richter > Group Klaus Richter
Projects:	SFB 689: Spinphänomene in reduzierten Dimensionen
Identification Number:	Value Type 10.1103/PhysRevB.77.184427 DOI 0803.3427 arXiv ID
Classification:	Notation Type 72.25.-b PACS 85.75.-d PACS
Dewey Decimal Classification:	500 Science > 530 Physics
Status:	Published
Refereed:	Yes, this version has been refereed
Created at the University of Regensburg:	Yes
Item ID:	7797

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Abstract

The electron conductance in planar magnetic tunnel junctions with long-range barrier disorder is studied within Glauber-eikonal approximation enabling exact disorder ensemble averaging by means of the Holtsmark-Markov method. This allows us to address a hitherto unexplored regime of the tunneling magnetoresistance effect characterized by the crossover from k_||-conserving to random tunneling ...

Abstract

The electron conductance in planar magnetic tunnel junctions with long-range barrier disorder is studied within Glauber-eikonal approximation enabling exact disorder ensemble averaging by means of the Holtsmark-Markov method. This allows us to address a hitherto unexplored regime of the tunneling magnetoresistance effect characterized by the crossover from k_||-conserving to random tunneling (k_|| is the in-plane wave vector) as a function of the defect concentration. We demonstrate that such a crossover results in a reentrant magnetoresistance: It goes through a pronounced minimum before reaching the disorder- and geometry-independent Julliere value at high defect concentrations.

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Metadata last modified: 04 Jun 2018 09:15

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