Magnetization switching of submicrometer Co dots induced by a magnetic force microscope tip

URN to cite this document:: urn:nbn:de:bvb:355-epub-79019
DOI to cite this document:: 10.5283/epub.7901

Kleiber, M. ; Kümmerlen, F. ; Löhndorf, M. ; Wadas, A. ; Weiss, Dieter ; Wiesendanger, Roland

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Date of publication of this fulltext: 05 Aug 2009 13:57

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Item type:	Article
Open Access Type:	Due to SHERPA/RoMEO
Journal or Publication Title:	Physical Review B
Volume:	58
Page Range:	p. 5563
Date:	1998
Institutions:	Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss
Dewey Decimal Classification:	500 Science > 530 Physics
Status:	Published
Refereed:	Yes, this version has been refereed
Created at the University of Regensburg:	Yes
Item ID:	7901

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Abstract

We have applied magnetic force microscopy (MFM) with an in situ electromagnet to study the switching of the magnetization of submicrometer Co dots fabricated by means of electron-beam lithography. By using the MFM tip as a local-field source, the magnetization of individual single-domain Co dots could be reversed. Micromagnetic simulations show that the switching process is induced by ...