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Magnetization switching of submicrometer Co dots induced by a magnetic force microscope tip

URN to cite this document:
Kleiber, M ; Kümmerlen, F ; Löhndorf, M ; Wadas, A ; Weiss, Dieter ; Wiesendanger, Roland
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Date of publication of this fulltext: 05 Aug 2009 13:57


We have applied magnetic force microscopy (MFM) with an in situ electromagnet to study the switching of the magnetization of submicrometer Co dots fabricated by means of electron-beam lithography. By using the MFM tip as a local-field source, the magnetization of individual single-domain Co dots could be reversed. Micromagnetic simulations show that the switching process is induced by ...


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