Scanning Hall Probe Microscopy with Shear Force Distance Control
Article
Schweinböck, T., Weiss, Dieter, Lipinski, M. and Eberl, K. (2000) Scanning Hall Probe Microscopy with Shear Force Distance Control. Journal of Applied Physics 87, p. 6496.Alternative links to fulltext
Involved Institutions
Details
| Item type | Article |
| Journal or Publication Title | Journal of Applied Physics |
| Volume | 87 |
| Page Range | p. 6496 |
| Date | 2000 |
| Date of publication | 05 Aug 2009 13:57 |
| Institutions | Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss |
| Dewey Decimal Classification | 500 Science > 530 Physics |
| Status | Published |
| Refereed | Yes, this version has been refereed |
| Created at the University of Regensburg | Yes |
| Item ID | 7909 |
Export bibliographical data
Owner only: item control page
More literature (via CORE)
More literature (via CORE)