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Kelvin probe spectroscopy of a two-dimensional electron gas below 300 mK

Vancura, T. and Kicin, S. and Ihn, Thomas and Ensslin, Klaus and Bichler, Max and Wegscheider, Werner (2003) Kelvin probe spectroscopy of a two-dimensional electron gas below 300 mK. Applied Physics Letters 83 (13), pp. 2602-2604.

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Abstract

A scanning force microscope with a base temperature below 300 mK is used for measuring the local electron density of a two-dimensional electron gas embedded in a Ga[Al]As heterostructure. At different separations between atomic force microscope tip and sample, a dc voltage is applied between the tip and the electron gas while simultaneously recording the frequency shift of the oscillating tip. ...

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Item Type:Article
Date:29 September 2003
Institutions:Physics > Institute of Experimental and Applied Physics > Retired Professors > Group Werner Wegscheider
Identification Number:
ValueType
10.1063/1.1614836DOI
Related URLs:
URLURL Type
http://link.aip.org/link/?APPLAB/83/2602/1Publisher
Classification:
NotationType
73.63.-bPACS
Keywords:gallium arsenide, aluminium compounds, III-V semiconductors, two-dimensional electron gas, atomic force microscopy, electron density, semiconductor heterojunctions
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Martin Kaiser
Deposited On:15 Dec 2009 08:58
Last Modified:13 Mar 2014 12:18
Item ID:11480
Owner Only: item control page

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